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​​Year 2015
  1. Hao Yu, and Chuan Seng Tan, Advances in 3D Integrated Circuits and Systems: World Scientific Publishing 2015
  2. Hao Yu, and Yang Shang, Design of CMOS Millimeter-wave and Terahertz Integrated Circuits with Metamaterials: CRC Press 2015

Year 2013
1. C. M. Tan and F. He, "Electromigration Modeling at Circuit Layout Level", NA : SpringerBrief on Reliability, 2013

Year 2012 
  1. Ruijing Shen, Sheldon X.D. Tan, and Hao Yu,, "Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs,", NA : Springer Publishing, 2012

Year 2011 
  1. Cher Ming Tan, Wei Li, Zhenghao Gan and Yuejin Hou, "Applications of finite element methods for reliability studies on ULSI Interconnections", United Kingdom: Springer Verlag, 2011

Year 2010 
  1. Yeo Kiat Seng, Do Manh Anh and Boon Chirn Chye, "Design of CMOS RF Integrated Circuits and Systems", Singapore: World Scientific Publishing, 2010
  2. Cher Ming Tan, "Electromigration in ULSI Interconnections", Edited by Chih-Tang Sah, Singapore: World Scientific, 2010
  3. Yeo Kiat Seng, Ng Kim Tean, Kong Zhi Hui, and Tricia Dang Bee Yoke, "Intellectual Property for Integrated Circuits", J. Ross Publishing (USA), International Edition, 2010

Year 2009 
  1. E. K. Chua & K. Y. See, "Full-Wave Equivalent Circuit for Printed Circuit Structures", Germany: VDM Verlag Publishing, 2009

Year 2008 
  1. Tan Cher Ming, "Simulated Annealing", IN-TECH, 2008

Year 2000 - 2007 
  1. Yeo Kiat Seng and Kaushik Roy, “Low-Voltage, Low-Power VLSI Subsystems”, New York: McGraw-Hill, 2005
  2. Yeo Kiat Seng, Samir S. Rofail and Goh Wang Ling, “CMOS/BiCMOS ULSI: Low-Voltage Low-Power,” New Jersey: Prentice-Hall, 2002
  3. Samir S. Rofail and Yeo Kiat Seng, "Low-Voltage Low-Power Digital BiCMOS Circuits: Circuit Design, Comparative Study and Sensitivity Analysis", New Jersey: Prentice-Hall, 2000
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